Test Program Coverage & Quality of Test Improvement

Achievement of optimum test program coverage and quality has become more challenging due to the ever-shortening product lifecycles and time-to-market (TTM) demands. In addition to the need for “seasoned” resources, there is also an acute demand for a consistent and disciplined approach for the validation of the quality and the coverage of a test program. While common reporting tools may help, they remain subjective, time consuming and skills reliant.


Express™ is an off-line test engineering assistant offering comprehensive analysis of large volumes of data to generate automated recommendations for:

• Test corrective actions:
  • Critical tests
  • Clamping
  • Invalid test limits
  • Alarms
• Test Efficiency

Express™ can be used to optimize test program coverage at Wafer Sort (EWS) and/or Final Test at any time during the life cycle of a product from engineering ramp-up to volume production.

Express™ Analysis

• Accounts for process variations, shifts, and trends
• Is tolerant of parametric anomalies (outliers)
• Is user-definable
• Is non-intrusive – no changes required to test program or platform, no test time impact
• Is tester independent – utilizes industry standard data format
• Allows use of historic results to incrementally converge to most accurate recommendations
• Allows performance of exhaustive and tailored analysis which is controlled and can be easily verified by the test engineer
• Offers ease of use with fully interactive recipes
• Enables objective and repeatable data analysis
• Offers data analysis with interactive display charts: scatter plot, trend plot, box plot, histogram, wafer map
• Allows access to any statistics results in raw and pure data: Min, Max, Median, Mean, Lower Quartile, Upper Quartile, Maximum, Standard Deviation, Cpk, PCI.