Comprehensive Fully Automated Advanced Outlier Detection

Streetwise™ is an integrated, in-line data analysis solution utilizing automatic algorithm selections for robust dynamic parametric outlier detection for all types of data population distributions at Wafer Test and is inclusive of the most powerful spatial outlier detection methodologies.

Test Advantage pioneered the idea of an “off-the-shelf,” fully automated, yield conscious solution for outlier detection and overall DPPM improvements with Streetwise Production™. With test floor-wide customer installations since year 2002, Streetwise offers production proven technology and is the leading advanced outlier detection coverage and DPPM improvement solution available in the market today.

Streetwise Targets “Zero Defects” and “Cost of Quality”
Streetwise™ advanced outlier detection offers a balanced and comprehensive approach with integrated data analysis software to effectively implement "Zero Defects" programs for high reliability devices and optimize "Cost of Quality" for consumer products.

Streetwise™ automatically selects highly advanced algorithms applied across all relevant tests per wafer at Wafer Sort which have been optimized per the unique data distribution represented, providing both a comprehensive (complete test coverage) and tailored analysis with accurate results. Unlike commonly used first and second generation “6-Sigma P.A.T.” and “Guard-Banding” methods, Streetwise sophisticated technology is unique in its ability to automatically capture and classify multiple dimensions of test data variances, thereby maximizing effectiveness and efficiency. More specifically, by capturing the measured degree of magnitude variance and frequency of occurrence for each test per device, Streetwise enables an unparalleled “enhanced resolution” of the data, providing binning and classification strategies for categorization of the highest probability “at risk” devices without sacrificing yield. This recipe driven automatic classification capability further lends itself to an enhanced device quality verification and categorization of the remaining population for further disposition decisions and potential market opportunities.

Streetwise Production Suite offers various production automation modules for:
• Parametric outlier detection coverage
• Part Average Testing (PAT) for Gaussian distributions
• Comprehensive outlier detection for other (non-Gaussian) distributions
• Drift analysis
• Multi-flow analysis
• Stepper pattern and/or other repetitive pattern detection
• Advanced spatial outlier detection
• Composite/Stacked lot analysis
• Merged ink-map generation for subsequent off-line inking
Streetwise Production is:
• Recipe Driven
• Test platform independent. Analysis is performed at run-time, utilizing tester data output.
• Extremely fast and robust, capable of handling large volumes of data in a production environment
• Fully automated for turn-key production integration